培训大纲：
1、DFT overview DFT 概述
What is and Why DFT;
VLSI implementation process;
Manufacturing Defect;
Manufacturing Test;
Automatic Test Equipment (ATE)
introduction
2、Test and fault 测试和故障
Observability and Controllability
Role of Test
Test Development Flow
Real Tests
DFT Cost
Fault Modeling
3、DFT Methods introduction DFT 方法学介绍
DFT Methods
Ad Hoc DFT
Scan Basic Concept
MBIST Basic Concept
LBIST Basic Concept
BSCAN Basic Concept
JTAG Architecture
IP Test
4、Mainstream DFT EDA tools and chip DFT
integrated solutions.主流DFT 工具与『芯片』DFT技术介绍
DFT Compiler (DC);
Mentor Testkompress/TessentMbist/
TessentBoundary Scan;
Synopsys TetraMAX;
Cadence Modus;
DFT integrated solutions;
5、Scan introduction ( with DFT compiler)『芯片』scan技术介绍
Understanding Scan Testing;
Scan Chain Insertion Flow Preview;
Test Protocols and DRC;
Test Ready Compile;
Top Down Scan Insertion Flow;
Bottom Up Scan Insertion Flow;
Scan Compression method
（XOR vs OPMISR）;
Lab DFT Compiler introduce
6、ATPG introduction.『芯片』ATPG技术介绍
What is testing and ATPG
Stuck at ATPG
Transition ATPG
Path delay ATPG
IDDQ ATPG
D algorithm
7、ATPG implementation ( with TestKompress/
